Application of an 8-Channel Simultaneous Sampling ADC (CM2248) in ATE Equipment

01 Introduction

The CM2248 is a 16-bit, 8-channel simultaneous sampling ADC launched by Simu Microelectronics. Each channel integrates analog input clamp protection, a second-order anti-aliasing filter, a track-and-hold amplifier, a 16-bit SAR ADC, and a flexible on-chip digital filter.

The CM2248 operates from a single 5 V supply while supporting true bipolar input signals of ±10 V or ±5 V. All channels can sample and output data at a throughput rate of 200 kSPS. The analog input impedance of each channel is 1 MΩ, and the input clamp protection circuitry can withstand overvoltage up to ±16.5 V. The device is pin-compatible with ADI’s AD7606 and TI’s ADS8588.

Appearance of the structure

Pin configuration

Architecture Diagram

Typical Connection Diagram

02 Features

(1)Bipolar analog input ranges: ±10 V, ±5 V

(2)5 V analog supply, VDRIVE: 2.3 V to 5 V

(3)8 simultaneous sampling input channels

(4)LQFP64 10 × 10 package

(5 )Fully integrated data acquisition solution

--Analog input clamp protection

--Input buffer with 1 MΩ analog input impedance

--Second-order anti-aliasing analog filter

--On-chip precision reference and buffer

--16-bit, 200 kSPS ADC (all channels)

--Oversampling capability via digital filtering

(6)Flexible parallel/serial interfaces

--SPI/QSPI/MICROWIRE/DSP compatible

(7)Performance

--Analog input ESD up to 8 kV

--92 dB SNR, –105 dB THD

--±1 LSB INL, ±0.8 LSB DNL

--Low power consumption: 150 mW in operating mode, 30 mW in standby mode

03 Solution Overview

With its high throughput, high level of integration, ease of use, and SNR of up to 92 dB, the CM2248 is well suited for signal acquisition applications in automated test equipment (ATE), including DPS (Device Power Supply), PMU (Parametric Measurement Unit), and PE (Pin Electronics).

As semiconductor process technology continues to advance, the requirements for semiconductor ATE systems have evolved from merely “meeting chip test functionality” to an era focused on test efficiency and flexibility—namely, “capital efficiency.” As chips become increasingly complex, initial wafer yield continues to decline and failure probability increases, driving the need for test systems that are both more accurate and more efficient.

To accommodate more test channels within a limited tester volume, ATE manufacturers are increasingly inclined to adopt highly integrated PMU, DPS, and PE circuits or devices. Regardless of whether the unit is PE, DPS, or PMU, a fast, easy-to-use, and high-precision ADC is required to perform electrical parameter feedback measurements. With a per-channel throughput of 200 kSPS and an SNR of 92 dB, the CM2248 enables ATE electrical measurements to be both fast and accurate.

04 Product Advantages

In summary, the CM2248 offers high integration, a high SNR of 92 dB, and excellent distortion performance with –105 dB THD, making it highly suitable for high-precision signal feedback acquisition in various ATE applications. In terms of performance, the CM2248 directly competes with ADI’s AD7606 and TI’s ADS8588.